Where she presented her innovative research on “On-Die Telemetry Circuitry for Measuring Clock Tree Timing Deterioration Due to Asymmetric Transistor Aging”, under the supervision of Prof. Shahar Kvatinsky and Freddy Gabbay.
This topic is of great significance because reliability is crucial for integrated circuits (ICs) to ensure accurate operation over a prolonged lifespan. With the increasing prevalence of mission-critical systems, maintaining high reliability is more essential than ever. Her research addresses this critical need, offering solutions to enhance the resilience and longevity of ICs in modern nanometer technology.
Great job Duna !!
